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External AwardsIEICE Communications Society Excellent Paper AwardWinner: Yoshitaka Enomoto, Tetsuya Iwado, Takashi Goto, Masaki Waki, Toshio Kurashima, and Yoshiyuki Kajihara, NTT Access Network Service Systems Laboratories Date: May 13, 2019 Organization: The Institute of Electronics, Information and Communication Engineers (IEICE) For “Design and Performance of Aerial Line Structure Inspection Support System with Mobile Mapping System.” Published as: Y. Enomoto, T. Iwado, T. Goto, M. Waki, T. Kurashima, and Y. Kajihara, “Design and Performance of Aerial Line Structure Inspection Support System with Mobile Mapping System,” IEICE Trans. Commun. (Japanese Edition), Vol. J100-B, No. 12, pp. 995–1003, 2017. Laser Society of Japan Achievement Award (Paper Prize)Winner: Atsushi Ishizawa, Tadashi Nishikawa, Kenichi Hitachi, and Hideki Gotoh, NTT Basic Research Laboratories Date: May 31, 2019 Organization: The Laser Society of Japan For “Ultra-precise Frequency Conversion Using an Electro-optic-modulation Frequency Comb.” Published as: A. Ishizawa, T. Nishikawa, K. Hitachi, and H. Gotoh, “Ultra-precise Frequency Conversion Using an Electro-optic-modulation Frequency Comb,” The Review of Laser Engineering, Vol. 46, No. 2, pp. 80–85, 2018. AVM AwardWinner: Masaaki Matsumura, NTT Media Intelligence Laboratories Date: June 14, 2019 Organization: The Special Interest Group of Audio Visual and Multi-media information processing, Information Processing Society of Japan (IPSJ-AVM) For “A Study for Prediction of Heating and Strain Using Audience Behavior.” Published as: M. Matsumura, A. Kameda, M. Isogai, H. Noto, and H. Kimata, “A Study for Prediction of Heating and Strain Using Audience Behavior,” IPSJ SIG Technical Report, Vol. 2018-AVM-101, No. 10, 2018. AVM AwardWinner: Shoichiro Takeda, NTT Media Intelligence Laboratories Date: June 14, 2019 Organization: IPSJ-AVM For “A Study of Quality of Experience Assessment for Video Magnification.” Published as: S. Takeda, A. Kameda, M. Isogai, and H. Kimata, “A Study of Quality of Experience Assessment for Video Magnification,” IPSJ SIG Technical Report, Vol. 2019-AVM-104, No. 9, 2019. Young Researcher AwardWinner: Takashi Hosono, NTT Media Intelligence Laboratories Date: June 28, 2019 Organization: The Institute of Image Electronics Engineers of Japan (IIEEJ) For “Depth Edge Based Objectness Metric for Generating Instance Candidate Regions.” Published as: T. Hosono, S. Tarashima, J. Shimamura, and T. Kinebuchi, “Depth Edge Based Objectness Metric for Generating Instance Candidate Regions,” Proc. of Visual/Media Computing Conference 2018, Yamagata, Japan, June 2018. Outstanding Research Presentation AwardWinner: Shoichiro Takeda, NTT Media Intelligence Laboratories Date: June 29, 2019 Organization: The Special Interest Group of Computer Graphics and Visual Informatics, IPSJ (IPSJ-CG) For “Local Riesz Pyramids for Faster Phase-based Video Magnification.” Published as: S. Takeda, M. Isogai, S. Shimizu, and H. Kimata, “Local Riesz Pyramids for Faster Phase-based Video Magnification,” IPSJ SIG Technical Report, Vol. 2019-CG-173, No. 4, 2019.Young Engineer Excellent Presentation AwardWinner: Takashi Miwa, NTT Device Innovation Center Date: July 5, 2019 Organization: Japan Association of Corrosion Control For “New Two-layer Paint System with Zinc Rich Paint.” Published as: T. Miwa, A. Ishii, and H. Koizumi, “New Two-layer Paint System with Zinc Rich Paint,” Proc. of the 39th Corrosion Control Conference, pp. 75–80, Tokyo, Japan, July 2018. Young Engineer Excellent Presentation AwardWinner: Azusa Ishii, NTT Device Innovation Center Date: July 5, 2019 Organization: Japan Association of Corrosion Control For “Effects of Water Spray on the Degradation Behavior of Poly(ethylene terephthalate) under Accelerated Weathering Test.” Published as: A. Ishii, T. Miwa, M. Watanabe, and S. Oka, “Effects of Water Spray on the Degradation Behavior of Poly(ethylene terephthalate) under Accelerated Weathering Test,” Proc. of the 39th Corrosion Control Conference, pp. 23–28, Tokyo, Japan, July 2018. Papers Published in Technical Journals and Conference ProceedingsExperimental Demonstration of Secure Quantum Remote SensingP. Yin, Y. Takeuchi, W. Zhang, Z. Yin, Y. Matsuzaki, X. Peng, X. Xu, J. Xu, J. Tang, Z. Zhou, G. Chen, C. Li, and G. Guo arXiv:1907.06480 [quant-ph], July 2019. Quantum metrology aims to enhance the precision of various measurement tasks by taking advantage of quantum properties. In many scenarios, precision is not the sole target; the acquired information must be protected once it is generated in the sensing process. Considering a remote sensing scenario where a local site performs cooperative sensing with a remote site to collect private information at the remote site, the loss of sensing data inevitably causes private information to be revealed. Quantum key distribution is known to be a reliable solution for secure data transmission; however, it fails if an eavesdropper accesses the sensing data generated at a remote site. In this study, we demonstrate that by sharing entanglement between local and remote sites, secure quantum remote sensing can be realized, and the secure level is characterized by asymmetric Fisher information gain. Concretely, only the local site can acquire the estimated parameter accurately with Fisher information approaching 1. In contrast, the accessible Fisher information for an eavesdropper is nearly zero even if he/she obtains the raw sensing data at the remote site. This achievement is primarily due to the nonlocal calibration and steering of the probe state at the remote site. Our results explore one significant advantage of “quantumness” and extend the notion of quantum metrology to the security realm. Proposal and Verification of Auto Calibration Technique for Bias Control Circuit Connecting to Imperfect IQ-modulatorH. Kawakami, S. Kuwahara, and Y. Kisaka Proc. of the 24th OptoElectronics and Communications Conference (OECC 2019), ThC2-2, Fukuoka, Japan, July 2019. We show that imperfection in an IQ-modulator degrades the accuracy of the auto bias control circuit connected to the modulator’s complementary port, and propose an auto calibration technique that can effectively suppress this degradation. |